Sitemap
This is all our content.
- Contact
- Research
- Research fields
- Societal challenges
- Projects
- Leading by Light Guidance
- Lensless imaging with EUV and Soft X-Rays (LINX)
- SYNOPTICS
- High performance single-photon detectors
- SEQUOIA Project
- Extreme UV and Soft X-Ray metrology
- Detection for space
- Advanced Traceable Metrology for Optical Constants (ATMOC)
- Graded Index optics
- Nano-optics for Metrology
- Far field nanoparticle detection
- Inverse electromagnetics for EUV mask metrology and inspection
- Metamaterials and metasurfaces
- Free Form Scattering Optics
- Finished projects
- ADOPSYS – Saddle point method for designing optical systems
- Computational imaging for pattern detection and machine vision
- Influence of the mechanical Environment on Optical Fiber based Sensor
- Liquid Lens Lab
- Spectr@phone
- Superresolution imaging with focused radially polarized beam
- Wavefront coding in barcode imaging system
- Phase Retrieval
- Electromagnetic modeling of SLM
- Characterization of nanostructures using optical far field techniques
- Optimization for complex optical system
- Fast 3D imaging of defects in semiconductor devices
- New methods and applications of Ptychography
- CFS for reconstruction of printed nanostructures
- Application of hyperbolic meta-materials
- Optics Netherlands
- Output
- Education
- About us
- People
- Paul Urbach
- Wim Coene
- Silvania Pereira
- Omar El Gawhary
- Aurèle Adam
- Florian Bociort
- Iman Esmaeil Zadeh
- Jian-Rong Gao
- Lidija Nikolic
- Chris Christie
- Roland Horsten
- Thim Zuidwijk
- Thomas Scholte
- Dingding Ren
- Dmytro Kolenov
- Naresh Sharma
- Anubhav Paul
- Behnoosh Babaghorbani
- Bruno Lopez Rodriguez
- Hui Wang
- Jan de Graaff
- Luuk Zonneveld
- Sander Senhorst
- Sarika Soman
- Shrouk Eid Zaki Ahmed
- Thomas van der Sijs
- Zizheng Li
- Wenye Ji
- Joseph Braat
- Man Xu
- Yifeng Shao