Omar El Gawhary

Optical metrology and superresolution

Optical topology and scattering

Laureaa degree in Electronics Engineering (Quantum Electronics) from “La Sapienza” University in Rome (Italy) (110/110 cum laude) (2000).

Industrial experience from 2000 until 2007, in private Telecom Sector in Italy as well as public Institutions, again Italy.

PhD in Physics (Optics, 2003-2007), from Roma Tre University in Rome (2007).

From 2008 to 2012 Post doctoral position at the Optics group of TU Delft. Research performed in strict collaboration with ASML.

From 2012-now, principal scientist at VSL, the National Metrology Institute of the Netherlands (situated in Delft).

From Sep 2017 – part-time Associate Professor at Delft University of Technology, ImPhys Depart, Optics Group.

Omar El Gawhary - associate-professor

Optical metrology and superresolution

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