Omar El Gawhary
Optical metrology and superresolution
Optical topology and scattering
Laureaa degree in Electronics Engineering (Quantum Electronics) from “La Sapienza” University in Rome (Italy) (110/110 cum laude) (2000).
Industrial experience from 2000 until 2007, in private Telecom Sector in Italy as well as public Institutions, again Italy.
PhD in Physics (Optics, 2003-2007), from Roma Tre University in Rome (2007).
From 2008 to 2012 Post doctoral position at the Optics group of TU Delft. Research performed in strict collaboration with ASML.
From 2012-now, principal scientist at VSL, the National Metrology Institute of the Netherlands (situated in Delft).
From Sep 2017 – part-time Associate Professor at Delft University of Technology, ImPhys Depart, Optics Group.